Training
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Failure Analysis
    • Liquid Crystal Analysis (LCA)/Fluorescent Microthermal Imaging (FMI)
    • SEM / FIB Passive Voltage Contrast
    • EDX
    • IROBIRCH
    • CSAM
    • SIMS
    • Photon Emission Microscopy
    • AFM
    • Delayering Process
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Design of Experiment
    • 4-factor-2-level full factorial designs
    • Taguchi designs
    • Data analysis using t-test, F-test, decision limits & analysis of variance (ANOVA)
MEMS
    • Introduction to MEMS
    • Brief History
    • Market
    • Applications - Automotive, RF, Biomedical
    • Technology Roadmaps
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